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Jožef Stefan
International
Postgraduate School

Jamova 39
SI-1000 Ljubljana
Slovenia

Phone: +386 1 477 31 00
Fax: +386 1 477 31 10
Email: info@mps.si

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Course Description

Ion Beam Analysis

Program

Sensor Technologies

Lecturers:

prof. dr. Primož Pelicon

Goals:

Objectives:
• student learns the capabilities and specifics of modern Ion Beam Analytical methods,
• student understands the structure of X-ray emission spectrum PIXE,
• student understands the physical processes and the corresponding shape of Rutherford backscattering spectrum,
• student determines the optimal ion beam type and energy for selected analytical problem.

Competences:
• student is capable to identify optimal IBA method for problem solving at his field of research,
• student able to use basic analytical software for the analysis of PIXE spectra and determination of trace element concentrations,
• student is able to use software for simulation and analysis of the backscattering spectra and is able to determine thin film stechiometry and elemental depth concentration profiles.

Content:

Interaction of fast ions with matter:
• Stopping
• Scattering
• Ionisation
• Nuclear excitation
Spectroscopic methods with ion scattering:
• Rutherford Backscattering Spectroscopy (RBS)
• Elastic Backscettering Spectroscopy (EBS)
• Elastic Recoil Detection Spectroscopy (ERDA)
Spectroscopic methods with photon emmision
• Particle-Induced X-ray Spectroscopy (PIXE)
• Particle-Induced Gamma-Spectroscopy (PIGE)
Nuclear Reaction Analysis (NRA)
• Spectroscopy based on (3He,p) reaction
• Hydrogen detection with 15N beam
• Spectroscopy based on (p, α) reaction
Application of focused high-energy ion beams
• Shaping of focused high-energy ion beams
• Acquisition principles of elemental mapping
• Scanning Transmission Ion Microscopy
• Proton Beam Writing (PBW)
Advanced methods of Ion Beam Analysis (IBA)
• MeV SIMS
• PIXE/STIM tomography
• Confocal PIXE
• Single ion irradiation
• In-air analysis
• IBA methods with position-sensitive detectors
• IBA methods based on Time-Of-Flight principle

Course literature:

Selected scientific journal publications:
• Nuclear Instruments and Methods in Phys. Res. B,
• Journal of Analytical Atomic Spectroscopy,
• Journal of applied Physics/Applied Physics Letters.

Book:
• Handbook of Modern Ion Beam Materials Analysis, Y. Wang, M. Nastasi, Cambridge University Press, 2010.

Significant publications and references:

• Število citatov / Number of citations (WoS): 611/461 without self-citations. H-index: 14.

5 selected units:
• PONGRAC, Paula, KREFT, Ivan, VOGEL-MIKUŠ, Katarina, REGVAR, Marjana, GERM, Mateja, VAVPETIČ, Primož, GRLJ, Nataša, JEROMEL, Luka, EICHERT, Diane, BUDIČ, Bojan, PELICON, Primož. Relevance for food sciences of quantitative spatially resolved element profile investigations in wheat (Triticum aestivum) grain. Journal of the Royal Society interface, 2013, vol. 10, no. 84, str. 1742-5662.
• NOVAK, Sara, DROBNE, Damjana, GOLOBIČ, Miha, ZUPANC, Jernej, ROMIH, Tea, GIANONCELLI, Alessandra, KISKINOVA, Maya Petrova, KAULICH, Burkhard, PELICON, Primož, VAUPETIČ, Primož, JEROMEL, Luka, OGRINC, Nina, MAKOVEC, Darko. Cellular internalisation of dissolved cobalt ions from ingested CoFe2O4 nanoparticles : in vivo experimental evidence. Environ. sci. technol., 2013, vol. 47, no. 10, str. 5400-5408.
• SINGH, Sudhir P., VOGEL-MIKUŠ, Katarina, ARČON, Iztok, VAVPETIČ, Primož, JEROMEL, Luka, PELICON, Primož, KUMAR, Jitendra, TULI, R. Pattern of iron distribution in maternal and filial tissues in wheat grains with contrasting levels of iron. J. Exp. Bot., 2013, vol. 64, no. 11, str. 3249-3260.
• GHOLAMI HATAM, Ebrahim, PELICON, Primož, LAMEHI-RACHTI, Mohammad, VAVPETIČ, Primož, KAKUEE, Omidreza, GRLJ, Nataša, ČEKADA, Miha, FATHOLLAHI, Vahid. Surface topography reconstruction by stereo-PIXE. J. anal. at. spectrom., 2012, vol. 27, issue 5, str. 834-840.
• PELICON, Primož, VAVPETIČ, Primož, GRLJ, Nataša, ČADEŽ, Iztok, MARKELJ, Sabina, BREZINŠEK, Sebastijan. Fuel retention study in fusion reactor walls by micro-NRA deuterium mapping. Nucl. instrum. methods phys. res., B Beam interact. mater. atoms., 2011, vol. 269, no. 20, str. 2317-2321.

Examination:

Seminar describing particular application of Ion Beam Analytical method in a research field close to the candidate (30%)
Project of quantitative analysis of IBA spectrum (20%)
Oral examination (50%)

Students obligations:

Seminar describing particular application of Ion Beam Analytical method in a research field close to the candidate.
Project of quantitative analysis of IBA spectrum.
Oral examination.

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