MPŠ MP&Scaron MP&Scaron MP&Scaron Avtorji

Jožef Stefan
Postgraduate School

Jamova 39
SI-1000 Ljubljana

Phone: +386 1 477 31 00
Fax: +386 1 477 31 10


Course Description

Characterisation of Structure


Nanosciences and Nanotechnologies, third-level study programme


prof. dr. Iztok Arčon


In this course, the students learn modern spectroscopic and microscopic methods for the characterization of the atomic and molecular structure of materials.


The course deals with the interaction between electromagnetic waves and matter in the wide frequency range from infrared to X-ray light. Students are acquainted in detail with individual spectroscopic methods which are most frequently used in the characterization of materials (crystalline and amorphous), liquid precursor, nanostructured matters and surfaces (e.g. X-ray absorption and emission spectroscopy, spectroscopies with UV, visible and IR light, XRD). The course presents the properties of the most important, particularly synchrotron light sources used by individual spectroscopic methods. Emphasis is placed on the applicability of individual spectroscopic methods and their complementarities. Students use real cases to check which combination of spectroscopic methods is optimal for the analysis of specific material properties.

Course literature:

Handbook on synchrotron radiation, edited by Ernst-Eckhard Koch General editors: D. E. Eastman & Y. Farge North-Holland
Publishing Company (1983)

X-ray absorption spectroscopy (principles, applications, techniques of EXAFS, SEXAFS and XANES), edited by D. C.
Konnigsberger and R. Prins, John Wiley and Sons, NY (1988)

M. Fernandez-Garcia, XANES analysis of catality systems under reaction conditions, Catalysis Reviews, 44(1), (2002) 59-121
J. J. Rehr, R. C. Albers, Theoretical approaches to x-ray absorption fine structure, Reviews of Modern Physics, Vol. 72, No. 3, July 2000, 621-654

The optical principles of the diffraction of x-rays, R. W. James, Ox bow press, Woodbridge, Connecticut (1962)

Principles of Instrumental analysis, D.A. Skoog, F.J. Holler, T.A.Nieman, Saunders Collage publishing, Chicago (1998)

I. Arčon, Introduction to XANES and EXAFS analysis. Nova Gorica: [I. Arčon], 2008. 35 str., ilustr. [COBISS.SI-ID 933883]

I. Arčon, X-ray absorption spectroscopy : a practical guide to structural analysis of materials with EXAFS and XANES analysis. Nova Gorica: [I. Arčon], 2008. 51 str., ilustr. [COBISS.SI-ID 934139]

V. Kaučič, N. Zabukovec Logar, I. Arčon,. Characterisation of microporous and mesoporous solids using complementary
diffraction and X-ray absorption spectroscopic techniques. V: Characterization techniques for zeolites and related materials: state of the art and recent developments. [S.l.: s.n.], 2008, str. 91-123. 2nd FEZA school 2008, Universite Pierre et marie Curie, Paris, September 1-2, 2008 [COBISS.SI-ID 3992602]

Literatura na svetovnem spletu/ Sources on the web:
I. Arčon: Spletno študijsko gradivo za rentgensko absorpcijsko spektrometrijo / X-ray absorption spectroscopy: in
M. Newville and B. Ravel: IFFEFIT - Programski paket za analizo spektrov EXAFS,

Significant publications and references:

I. Arčon, A. Pastrello, L. catalano, M. De Nobili, P. Pierpaolo Cantone, L. Leita, Interaction between Fe-Cyanide Complex and Humic Acids Environ. chem. lett. (Internet), vol. 4, (2006), 191-194.

B. Malič, I. Arčon, A. Kodre, M. Kosec, Homogeneity of Pb(Zr, Ti)O3 thin films by chemical solution deposition : extended x-ray absorption fine structure spectroscopy study of zitconium local environment. J. Appl. Phys., 100, (2006), 051612-051612-8

I. Arčon, J. Kolar, A. Kodre, D. Hanžel, M. Strlič, XANES analysis of Fe valence in iron gall inks. X-ray spectrom., vol. 36, (2007) 199-205

J. Padežnik Gomilšek, I. Arčon, S. de Panfilis, A. Kodre, X-ray absorption coefficient of iodine in the K edge region, J. Phys. B: At. Mol. Opt. Phys. 41 (2008) 025003

I. Arčon, J. T. van Elteren, H. J. Glass, A. Kodre, Z. Šlejkovec, EXAFS and XANES study of Arsenic in contaminated soil, X-ray Spectrometry, 34 (2005) 435 - 438


Type (examination, oral, coursework, project):
• projects and oral exam

Students obligations:

• projects and oral exam