Učni načrt predmeta

Predmet:
Mikroskopske in mikroanalizne metode
Course:
Microscopical and Microanalytical Methods
Študijski program in stopnja /
Study programme and level		 Študijska smer /
Study field		 Letnik /
Academic year		 Semester /
Semester
Nanoznanosti in nanotehnologije, 3. stopnja / 1 1
Nanosciences and Nanotechnologies, 3rd cycle / 1 1
Vrsta predmeta / Course type
Izbirni / Elective
Univerzitetna koda predmeta / University course code:
NANO3-813
Predavanja
Lectures		 Seminar
Seminar		 Vaje
Tutorial		 Klinične vaje
work		 Druge oblike
študija		 Samost. delo
Individ. work		 ECTS
30 30 30 210 10

*Navedena porazdelitev ur velja, če je vpisanih vsaj 15 študentov. Drugače se obseg izvedbe kontaktnih ur sorazmerno zmanjša in prenese v samostojno delo. / This distribution of hours is valid if at least 15 students are enrolled. Otherwise the contact hours are linearly reduced and transfered to individual work.

Nosilec predmeta / Course leader:
prof. dr. Miran Čeh
Sodelavci / Lecturers:
prof. dr. Goran Dražić , doc. dr. Erik Zupanič , prof. dr. Sašo Šturm
Jeziki / Languages:
Predavanja / Lectures:
Slovenščina, angleščina / Slovene, English
Vaje / Tutorial:
Pogoji za vključitev v delo oz. za opravljanje študijskih obveznosti:
Prerequisites:

Poznavanje in razumevanje osnov fizike in kemije trdnega stanja in elektronske optike.

Knowledge and understanding of the basic concepts of physics and chemistry of condensed matter and electron optics.

Vsebina:
Content (Syllabus outline):

Predmet obsega teoretične osnove in praktično delo z naslednjimi tehnikami:
- elektronska mikroskopija: vrstična elektronska mikroskopija (SEM), presevna elektronska mikroskopija (TEM, CTEM, HRTEM), elektronska difrakcija (SAD, mikrodifrakcija), vrstična presevna elektronska mikroskopija (STEM, HAADF-STEM, ABF)
- posebne tehnike elektronske mikroskopije: in situ mikroskopija, elektronska holografija, 3D tomografija, elektronska precesija
- mikroanaliza in spektroskopija: energijsko-disperzijska spektroskopija rentgenskih žarkov (EDXS), valovno-disperzijska spektroskopija rentgenskih žarkov (WDXS), spektroskopija izgub energije elektronov (EELS)
- tipalna mikroskopija (SPM): vrstična tunelska mikroskopija (STM ), mikroskopija na atomsko silo (AFM)

The course includes theoretical and practical work with the following techniques:
- Electron microscopy: scanning electron microscopy (SEM), transmission electron microscopy (TEM, CTEM, HRTEM), electron diffraction (SAD, micro-diffraction), scanning transmission electron microscopy (STEM, HAADF-STEM, ABF)
- Special electron microscopy techniques: in-situ microscopy, electron holography, 3D tomography, electron precession
- Microanalysis and spectroscopy: energy-dispersive X-ray spectroscopy (EDXS), wave-dispersive X-ray spectroscopy (WDXS), electron energy loss spectroscopy (EELS)
- Scanning probe microscopy (SPM): scanning tunnelling microscopy (STM), atomic force microscopy (AFM)

Temeljna literatura in viri / Readings:

J. I. Goldstein et al., Scanning Electron Microscopy and X-ray Microanalysis, Springer, 4th edition, 2017.
D. B. Williams, C. B. Carter, Transmission Electron Microscopy, Plenum Press, 2009.
Ludwig Reimer, Transmission Electrons Microscopy, Springer, 2008.
R. Wiesendanger, Scanning probe microscopy and spectroscopy, Methods and applications,
Cambridge University Press, Cambridge, 1994.
Aberration-Corrected Analytical Transmission Electron Microscopy, edited by Rik Brydson, Wiley
and sons, 2011.

Cilji in kompetence:
Objectives and competences:

Seznaniti študente s pomembnimi modernimi mikroskopskimi in mikroanaliznimi tehnikami, ki omogočajo identifikacijo in karakterizacijo strukture in kemijske sestave materialov na mikro-, nano- in atomarnem nivoju.

Splošne kompetence:
- zmožnost uporabe (pod nadzorom) zahtevnih eksperimentalnih tehnik, vrednotenja postopkov in procesov ter razvoja kritične in samokritične presoje pridobljenih rezultatov;
- sposobnost nadaljnjega izpopolnjevanja in uporabe pridobljenega znanja v praksi;
- razvoj komunikacijskih sposobnosti in spretnosti, tako v domačem kot v mednarodnem okolju;
- sodelovanje in skupinsko delo.

Predmetnospecifične kompetence:
Predmet daje potrebno teoretično znanje in pripravlja študente za samostojno raziskovalno delo na eksperimentalno zahtevnem področju.

To get the students acquainted with the most important and recent microscopic and microanalytical methods for identification and characterization of the structure and chemical composition of materials on micro-, nano- and atomic scale.

General Competences:
- ability to perform (under supervision) the sophisticated experimental techniques, to evaluate the procedures and processes and to acquire critical and self-critical judgment of the acquired results;
- ability to acquire additional knowledge and to apply it in solving practical problems;
- improvement of communication abilities within domestic and international communities;
- collaboration and team work.

Course Specific Competences:
The course provides necessary theoretical knowledge and prepares the students for independent research work in the experimentally demanding field.

Predvideni študijski rezultati:
Intendeded learning outcomes:

Znanje in razumevanje:
- razumevanje fizikalnih pojavov, na katerih so osnovane mikroskopske in mikroanalizne metode;
- sposobnost kritičnega vrednotenja in predstavitve rezultatov v sodelovanju z mentorjem.

Knowledge and understanding:
- understanding of physical processes on which the microscopic and microanalytical methods are based;
- ability of a critical evaluation and presentation of the results under supervision of the mentor.

Metode poučevanja in učenja:
Learning and teaching methods:

Predavanja, seminarji, naloge, konzultacije, praktične vaje na opremi za elektronsko mikroskopijo in analizo površin.

Lectures, seminars, coursework, consultations, practical work on the equipment for electron microscopy and surface analysis.

Načini ocenjevanja:
Delež v % / Weight in %
Assesment:
Ustni izpit
80 %
Oral examination
Seminarji
10 %
Seminars
Naloge
10 %
Assignments
Reference nosilca / Lecturer's references:
1. V. Šrot, M. Gec, P. van Aken, J.H. Jeon, M. Čeh, Influence of TEM specimen preparation on chemical composition of Pb(Mg1/3Nb2/3)O3-PbTiO3 single crystals. Micron, ISSN 0968-4328. [Print ed.], 2014, vol. 62, str. 37-42.
2. A. Šestan, L. Sreekala, S. Markelj, M. Keleman, J. Zavašnik, C. Liebscher, G. Dehm, T. Hickel, M. Čeh, S. Novak, P. Jenuš, Non-uniform He bubble formation in W/W2CW/W2C composite : experimental and ab-initio study. Acta materialia, 2022, p. 15
3. Ž. Marinko, L. Suhadolnik, Z. Samardžija, J. Kovač, M. Čeh, The influence of a surface treatment of metallic titanium on the photocatalytic properties of TiO2 Nanotubes grown by anodic oxidation, Catalysts, 2021, vol. 10, no. 7, 803-1-803-16
4. L. Kelhar, J. Bezjak, M. Maček, J. Zavašnik, S. Šturm, P. Koželj, S. Kobe, J.M. Dubois, The role of Fe and Cu additions on the structural, thermal and magnetic properties of amorphous Al-Ce-Fe-Cu alloys, Journal of non-crystalline solids, 2017, 9.
5. G.I. Akmehmet, S. Šturm, M. Komelj, Z. Samardžija, B. Ambrožič, M. Sezen, M. Čeh, C. Ow-Yang, Origin of long afterglow in strontium aluminate phosphors : atomic scale imaging of rare earth dopant clustering. Ceramics international, 2019, vol. 45, iss. 16, 0. 20073-20077