Latest Academic Works
New approaches in calibration for multielement laser ablation inductively coupled plasma mass spectrometry analysis
One of commonly used analytical technique for direct elemental analysis of solid samples is Laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS). Although widely used for the analysis of various samples, obtaining accurate quantitative results remains a major challenge as matrix-matched standards are required. The aim of this thesis was …
Optimization of ToF-SIMS depth profiling in low-pressure H2, C2H2, CO and O2 atmosphere
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a versatile analytical method widely used in the field of surface science and thin films. Although it gives elemental, molecular, and isotopic information, it has a very low detection limit and high lateral resolution, is fast and works with all the vacuum-compatible samples, …
Optimization and application of MeV time-of-flight secondary ion mass spectrometry in the standard and low primary ion beam energy mode
Time-of-flight secondary ion mass spectrometry using MeV ions (MeV ToF SIMS) has been around for a few decades as a reliable, surface-sensitive method for the detection of molecular ions having masses up to 1000 Da. It provides excellent lateral resolution of a few μm for imaging of organic samples, making …