COURSES

Goals

Objectives: - student learns the capabilities and specifics of modern Ion Beam Analytical methods, - student understands the structure of X-ray emission spectrum PIXE, - student understands the physical processes and the corresponding shape of Rutherford backscattering spectrum, - student determines the optimal ion beam type and energy for selected analytical problem. Competences: - student is capable to identify optimal IBA method for problem solving at his field of research, - student able to use basic analytical software for the analysis of PIXE spectra and determination of trace element concentrations, - student is able to use software for simulation and analysis of the backscattering spectra and is able to determine thin film stechiometry and elemental depth concentration profiles.

Curriculum

Interaction of fast ions with matter: - Stopping - Scattering - Ionisation - Nuclear excitation Spectroscopic methods with ion scattering: - Rutherford Backscattering Spectroscopy (RBS) - Elastic Backscettering Spectroscopy (EBS) - Elastic Recoil Detection Spectroscopy (ERDA) Spectroscopic methods with photon emmision: - Particle-Induced X-ray Spectroscopy (PIXE) - Particle-Induced Gamma-Spectroscopy (PIGE) Nuclear Reaction Analysis (NRA): - Spectroscopy based on (3He,p) reaction - Hydrogen detection with 15N beam - Spectroscopy based on (p, α) reaction Application of focused high-energy ion beams: - Shaping of focused high-energy ion beams - Acquisition principles of elemental mapping - Scanning Transmission Ion Microscopy - Proton Beam Writing (PBW) Advanced methods of Ion Beam Analysis (IBA): - MeV SIMS - PIXE/STIM tomography - Confocal PIXE - Single ion irradiation - In-air analysis - IBA methods with position-sensitive detectors - IBA methods based on Time-Of-Flight principle