Search Results (2)
Optimization and application of MeV time-of-flight secondary ion mass spectrometry in the standard and low primary ion beam energy mode
Time-of-flight secondary ion mass spectrometry using MeV ions (MeV ToF SIMS) has been around for a few decades as a reliable, surface-sensitive method for the detection of molecular ions having masses up to 1000 Da. It provides excellent lateral resolution of a few μm for imaging of organic samples, making …
Ostanki bisfenolov v vodnem okolju: pojavnost in kroženje
Bisphenols are a group of industrial chemicals increasingly recognized as contaminants of emerging concern because of their presence in the environment and endocrine disrupting effects. They are used in the production of polycarbonate plastic, epoxy resins and thermal paper, in most cases without restriction. The global exception is bisphenol A, …